Study of Nitride Crack Reduction For Electronic Power Devices

Zhong, Nick Chenchao; Yogeswaran, Nivasan; Fan, Haibo; Gajda, Mark A.

doi:10.1109/icsj59341.2023.10339530

2023 IEEE CPMT Symposium Japan (ICSJ) 2023

DOI: 10.1109/icsj59341.2023.10339530

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Study of Nitride Crack Reduction For Electronic Power Devices

Nick Chenchao Zhong,

Nivasan Yogeswaran,

Haibo Fan

et al.

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Study of Nitride Crack Reduction For Electronic Power Devices

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References 9 publications

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