Study of Phase Imaging Contrast Optimization in Tapping Mode Atomic Force Microscopy

Abstract

In tapping mode atomic force microscopy (TM‐AFM), the phase image can reveal more about the physicochemical properties of the sample surface than the topography image, making it widely utilized in fields such as materials science and life sciences. However, obtaining high phase contrast in phase images during experiments is challenging, thus studying the phase imaging theory of TM‐AFM and optimizing phase contrast methods hold significant importance. This paper derives a theoretical expression for phase contrast based on phase theory, discovering that phase contrast is directly related to the frequency ratio and background dissipation quality factor. Through theoretical, experimental, and simulation approaches, optimization methods for phase contrast were proposed from the perspectives of frequency ratio and background dissipation quality factor as follows: (1) By fitting experimental results with the theoretical expression for phase contrast, the optimal frequency ratio for scanning can be determined, and imaging with this optimal ratio can enhance phase contrast and (2) reducing the width ratio between the free and fixed ends of the probe can decrease background dissipation, increase the proportion of core dissipation in the total energy dissipation of the probe, and thereby improve phase imaging contrast. These findings are significant in guiding TM‐AFM phase scanning experiments and optimizing phase imaging contrast.