The phase retardation angle, ~~. as a function of the incident angle was measured to study adsorption and depletion of polymers near a solid substrate from a solution by use of an evanescent wave ellipsometry technique. A lightly sulfonated ionomer dissolved in a polar solvent displayed an appreciable interfacial adsorption layer, while the nonionic precursor in ethyl acetate exhibits a depleted concentration profile. The results are in good agreement with adsorption or depletion layer profiles obtained previously by other techniques, i.e., X-ray fluorescence for polymer adsorption and optical fluorescence evanesent wave technique for depletion.