Study on annealing effect of bipolar transistors at different temperatures after total dose irradiation

Mo, Rigen; Li, Pengwei; Lyu, He; Mei, Bo; Sun, Yi; Yu, Qingkui; Cao, Shuang; Wang, Qianyuan; Zhang, Hongwei

doi:10.1016/j.microrel.2023.115125

Microelectronics Reliability

2023

DOI: 10.1016/j.microrel.2023.115125

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Study on annealing effect of bipolar transistors at different temperatures after total dose irradiation

Rigen Mo,

Pengwei Li,

He Lyu

et al.

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Study on annealing effect of bipolar transistors at different temperatures after total dose irradiation

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References 15 publications

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