Study on Wear Debris Distribution and Performance Degradation of Electrical Connector Under Step Random Vibration Stress

Luo, Yanyan; Qi, Qiaoshen; Wang, Yongpeng; Wu, Xiongwei; Ma, Xuan

doi:10.1109/tcpmt.2024.3446576

IEEE Trans. Compon., Packag. Manufact. Technol.

2024

DOI: 10.1109/tcpmt.2024.3446576

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Study on Wear Debris Distribution and Performance Degradation of Electrical Connector Under Step Random Vibration Stress

Yanyan Luo,

Qiaoshen Qi,

Yongpeng Wang

et al.

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Study on Wear Debris Distribution and Performance Degradation of Electrical Connector Under Step Random Vibration Stress

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References 15 publications

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