2012
DOI: 10.1364/oe.20.020551
|View full text |Cite
|
Sign up to set email alerts
|

Sub-wavelength GaN-based membrane high contrast grating reflectors

Abstract: The GaN-based membrane high contrast grating (HCG) reflectors have been fabricated and investigated. The structural parameters including grating periods, grating height, filling factors and air-gap height were calculated to realize high reflectivity spectra with broad bandwidth by the rigorous coupled-wave analysis and finite-difference time-domain method. Based on the optimized simulation results, the GaN-based membrane HCGs were fabricated by e-beam lithography and focused-ion beam process. The fabricated Ga… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1

Citation Types

0
22
0

Year Published

2015
2015
2020
2020

Publication Types

Select...
7
2

Relationship

0
9

Authors

Journals

citations
Cited by 40 publications
(22 citation statements)
references
References 21 publications
0
22
0
Order By: Relevance
“…A novel approach is to use high-contrast gratings (HCGs), fabricated from semiconductors or high refractive index (highindex) dielectrics [17][18][19] , that can be designed with large reflection 20 or transmission 21 efficiencies. Wavefront control was originally achieved by rendering one dimensional gratings aperiodic by gradually modifying the local period and duty cycle of the grating [21][22][23] .…”
mentioning
confidence: 99%
“…A novel approach is to use high-contrast gratings (HCGs), fabricated from semiconductors or high refractive index (highindex) dielectrics [17][18][19] , that can be designed with large reflection 20 or transmission 21 efficiencies. Wavefront control was originally achieved by rendering one dimensional gratings aperiodic by gradually modifying the local period and duty cycle of the grating [21][22][23] .…”
mentioning
confidence: 99%
“…A main challenge in the fabrication of a III-nitride-based HCG is to find a sacrificial layer that can be selectively removed without affecting the HCG layer. There have been a few attempts, such as bandgap-selective photoelectrochemical etching of a sacrificial InGaN superlattice to form an AlGaN HCG membrane 74 however, with a limited airgap height, and focused-ion-beam etching to create an airgap underneath a GaNbased HCG 75 , an impractical process for device integration on a wafer-scale. In addition, GaN membrane gratings have been fabricated from a GaN-on-Si structure [76][77][78] by selective etching of Si, and free-standing hafnium-oxide gratings using the same approach 79 , but applying this concept to fabricate a bottom mirror in a VCSEL is not straightforward, since growth of high-quality GaN on Si for laser applications is very challenging.…”
Section: Mirrorsmentioning
confidence: 99%
“…However much inferior performance has been achieved for GaN-based HCGs due to difficulties in this material system: there is no simple way to find a sacrificial layer with high wet etch selectivity to GaN. Attempts to realize III-nitride membrane type HCG structures for the visible regime have been limited to bandgap selective photoelectrochemical (PEC) etching of InGaN superlattices 74 , and focused-ion-beam (FIB) etching 75 , to make airgaps.…”
Section: Tio2/air High Contrast Grating Reflectors For Gan-based Vcselsmentioning
confidence: 99%
“…A main challenge in the fabrication of a III-nitride-based HCG is to find a sacrificial layer that can be selectively removed without affecting the HCG layer. There have been a few attempts, such as bandgap-selective photoelectrochemical etching of a sacrificial InGaN superlattice to form an AlGaN HCG membrane, 9 however, with a limited airgap height, and focused-ion-beam etching to create an airgap underneath a GaN-based HCG, 10 an impractical process for device integration on a wafer-scale. In addition, GaN membrane gratings have been fabricated from a GaN-on-Si structure by selective etching of Si, [11][12][13] but applying this concept to fabricate a bottom mirror in a VCSEL is not straightforward, since growth of high-quality GaN on Si for laser applications is very challenging.…”
Section: Introductionmentioning
confidence: 99%