2017
DOI: 10.1111/ijac.12768
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Subcritical crack growth behavior of a perovskite‐structured Ba0.5Sr0.5Co0.8Fe0.2O3−δ oxygen transport membrane

Abstract: This paper herein studies subcritical crack growth (SCG) behaviour of a perovskite-structured Ba0.5Sr0.5Co0.8Fe0.2O3−δ (BSCF) as an oxygen transport membrane material. The SCG behaviour of BSCF is evaluated by a constant load method and constant stress rate method at room temperature (RT) and 800 °C in air, respectively. The low crack velocity measurements are carried out by ring-on-ring bending tests while the high crack velocity measurements by compact tension tests.The stress rates vary approximately from 0… Show more

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Cited by 3 publications
(4 citation statements)
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“…A strength‐probability‐time (SPT) diagram was constructed to express the relationship between stress, failure probability and lifetime 54‐56,58 . Since low Weibull modulus and low characteristic strength indicate high failure probabilities at low stresses, the lower uncertainty limit of an SPT line at a given lifetime (t) was obtained using the lower confidence bound of Weibull modulus (m) and the lower uncertainty limit of characteristic strength (σt).…”
Section: Methodsmentioning
confidence: 99%
See 3 more Smart Citations
“…A strength‐probability‐time (SPT) diagram was constructed to express the relationship between stress, failure probability and lifetime 54‐56,58 . Since low Weibull modulus and low characteristic strength indicate high failure probabilities at low stresses, the lower uncertainty limit of an SPT line at a given lifetime (t) was obtained using the lower confidence bound of Weibull modulus (m) and the lower uncertainty limit of characteristic strength (σt).…”
Section: Methodsmentioning
confidence: 99%
“…A strength-probability-time (SPT) diagram was constructed to express the relationship between stress, failure probability and lifetime. [54][55][56]58 Since low Weibull modulus and low characteristic strength indicate high failure probabilities at low stresses, the lower uncertainty limit of an SPT line at a given lifetime (t) was obtained using the lower confidence bound of Weibull modulus (m) and the lower uncertainty limit of characteristic strength ( t ). Correspondingly, the upper uncertainty limit of an SPT line at a given lifetime (t) was derived by using the upper confidence bound of Weibull modulus and the upper uncertainty limit of characteristic strength ( t ).…”
Section: Methodsmentioning
confidence: 99%
See 2 more Smart Citations