Successful yield ramp using product test, scan and memory diagnosis

Abstract

Fast yield ramp is very important for a foundry during advanced process development and volume production. Logic and SRAM circuits are the major design blocks in advanced Integrated Circuits.Identification of systematic failures in logic and SRAM blocks using product test and diagnostics is critical to increasing the speed of yield learning in sub-40nm ICs. This paper highlights the importance of using logic and SRAM diagnosis for product yield ramp using three yield breakthroughs.