"Super" cocktails for heavy ion testing

Prater

Brown³

et al. 2009

IEEE Trans. Nucl. Sci.

The Single Event Effect (SEE) characterization of a Digital to Analog Converter showed an unexpected Single Event Transient (SET) dependence on operating conditions. The worst case condition resulting in the highest probability of an SET was at the highest supply voltage. The SET signatures were dependent on the input code, with some signatures not present when the input code was at mid scale. The SET characterization results are presented, along with a simulation study that explains the SET response dependence on the operating conditions. These results emphasize the importance of running an SEE characterization on a mixed signal product and monitoring all aspects of the SET signatures, including probability, amplitude, pulse width and oscillatory behavior, to determine the worst case operating conditions. Index Terms-Digital to analog converter (DAC), mixed signal, single event transient (SET), single event upset (SEU).

Section: Test Methodsmentioning

confidence: 99%

“…The 4.5 MeV/nucleon cocktail was used during the testing, with all testing done at normal incidence. The ions available, linear energy transfers (LET) and penetration depths are listed in Table I, [11]. Not all ions were used at each test session.…”

Section: Test Methodsmentioning

confidence: 99%

Single Event Transient Response Dependence on Operating Conditions for a Digital to Analog Converter

Prater

Brown³

et al. 2009

IEEE Trans. Nucl. Sci.

“…The 4.5 MeV/nucleon beam was used [9]. Ions used, linear energy transfers (LET) and penetration range into silicon are shown in Table I.…”

Section: Test Methodsmentioning

confidence: 99%

Use of Code Error and Beat Frequency Test Method to Identify Single Event Upset Sensitive Circuits in a 1 GHz Analog to Digital Converter

Rennie

Ramachandran

2008

IEEE Trans. Nucl. Sci.

Typical test methods for characterizing the single event upset performance of an analog to digital converter (ADC) have involved holding the input at static values. As a result, output error signatures are seen for only a few input voltage and output codes. A test method using an input beat frequency and output code error detection allows an ADC to be characterized with a dynamic input at a high frequency. With this method, the impact of an ion strike can be seen over the full code range of the output. The error signatures from this testing can provide clues to which area of the ADC is sensitive to an ion strike.Index Terms-Analog-digital conversion, beat frequency, code error, single event upset.

“…The heavy ion testing in these studies was conducted at the Lawrence Berkeley National Laboratory 88" cyclotron, using the 4.5 MeV/nucleon beam. For this beam energy, the ion penetration is between 41 to 67 µm into the silicon [16]. Some of the lack of SET sensitivity perceived may be due to the reduced beam penetration.…”

Section: Impact Of Input Voltagementioning

confidence: 99%

Single Event Transient (SET) Response of National Semiconductor's ELDRS-Free LM139 Quad Comparator

2009 IEEE Radiation Effects Data Workshop

Büchner

DasGupta

2009

Heavy ion and pulsed laser Single Event Transient (SET) data are presented for National Semiconductor's LM139AxLQMLV (5692R9673802VxA). The SET signatures for this part are compared to older versions of the part. The results confirm complications in performing SET testing on bipolar analog products reported by others plus raise new considerations when evaluating SET test results. 65 978-1-4244-5092-3/09/$26.00 ©2009 IEEE