2007
DOI: 10.1116/1.2432350
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Surface and depth profile investigation of a phosphorylcholine-based contact lens using time of flight secondary ion mass spectrometry

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Cited by 5 publications
(2 citation statements)
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“…Some researchers showed the surface changes by AFM after daily wear to investigate the wearing effect of the lens [26,27]. Surface techniques such as X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary ion mass spectrometry (ToF-SIMS) were also used to analyze the pigment distribution as well as lens materials [28][29][30][31][32][33][34][35]. Among the surface analytical techniques, AFM is a wellestablished technique for flatness analysis and imaging of biomaterial surfaces so that it has been often used to analyze the roughness of various soft contact lenses [21][22][23][24].…”
Section: Introductionmentioning
confidence: 99%
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“…Some researchers showed the surface changes by AFM after daily wear to investigate the wearing effect of the lens [26,27]. Surface techniques such as X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary ion mass spectrometry (ToF-SIMS) were also used to analyze the pigment distribution as well as lens materials [28][29][30][31][32][33][34][35]. Among the surface analytical techniques, AFM is a wellestablished technique for flatness analysis and imaging of biomaterial surfaces so that it has been often used to analyze the roughness of various soft contact lenses [21][22][23][24].…”
Section: Introductionmentioning
confidence: 99%
“…Above all, ToF-SIMS has been used to obtain the surface chemical information of contact lenses [30][31][32][33][34][35]. It has previously been used to investigate soft contact lens materials, providing chemical information on the surface.…”
Section: Introductionmentioning
confidence: 99%