2012
DOI: 10.1039/c2sm07179g
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Synchrotron XRR study of soft nanofilms at the mica–water interface

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Cited by 39 publications
(50 citation statements)
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“…The deviation in the results from 4 repeated measurements for each liposome samples was within 10%. [53][54][55][56] The SLBs were formed by incubating PEI-coated silicon/silica substrates in SUV-QDs dispersion for 3 h and then rinsing with PBS. XRR data was plotted as the reflectivity, ܴ, against momentum transfer vector along the perpendicular direction of the sample surface, ܳ ൌ 4ߨ ߣ ⁄ ‫݊݅ݏ‬ሺ2ߠ 2 ⁄ ሻ where ߠ is the angle of incidence.…”
Section: Quartz Crystal Microbalancementioning
confidence: 99%
“…The deviation in the results from 4 repeated measurements for each liposome samples was within 10%. [53][54][55][56] The SLBs were formed by incubating PEI-coated silicon/silica substrates in SUV-QDs dispersion for 3 h and then rinsing with PBS. XRR data was plotted as the reflectivity, ܴ, against momentum transfer vector along the perpendicular direction of the sample surface, ܳ ൌ 4ߨ ߣ ⁄ ‫݊݅ݏ‬ሺ2ߠ 2 ⁄ ሻ where ߠ is the angle of incidence.…”
Section: Quartz Crystal Microbalancementioning
confidence: 99%
“…Synchrotron XRR measurements were performed at beamline BM28-XMaS, European Synchrotron Radiation Facility (ESRF), Grenoble, France. A custom-designed liquid cell shown schematically in Figure 1 [32,38,41] was used for XRR experiments, with graphene samples mounted on the sample stage. The cell was sealed by two polyester (Mylar®) windows, providing a total liquid capacity of 5 ml.…”
Section: Experimental Methodsmentioning
confidence: 99%
“…53 To address the above-mentioned factors such as surface charge and hydrophilicity of PEM cushions that affect formation of supported lipid bilayers, in this work we have focused on characterising wetting, surface free energy and zeta potential of a number of PEMs. Furthermore, the structure of PEMs was also characterized by X-ray reflectometry (XRR), which has been used to characterise soft nanofilms [54][55] and previously used to characterise PEMs. 18 XRR can yield useful structural details on the thickness, roughness and electron density, which could be correlated with the physical density of PEMs.…”
Section: Please Do Not Adjust Marginsmentioning
confidence: 99%
“…The XRR measurements [54][55]57 were performed at beamline BM28 at the European Synchrotron Radiation Facility (ESRF), Grenoble, France. The BM28 monochromator was tuned to select an X-ray beam energy of 14keV with a corresponding wavelength λ=0.886Å.…”
Section: Synchrotron X-ray Reflectometry (Xrr) Measurementsmentioning
confidence: 99%