Synthesis, Characterization and Water Vapor Sensitivities of Nanocrystalline SnO₂ Thin Films

Abstract

Thin films of SnO 2 were prepared via wet chemical method and deposited by dip-coating on glass substrate. The annealing temperatures of the samples were 300, 400, 500 and 600 o C, respectively. Water vapor sensor responses were measured and the experimental results are tested using the Freundlich model. The better water vapor sensitivities were obtained for annealing temperatures of 500 and 600 o C, respectively. The samples were characterized morphological and structurally by SEM, XRD, Mössbauer spectroscopy and Raman spectroscopy. The fringes features in the ultraviolet-visible region indicate films thickness around 370 nm. The results are discussed in terms of the fine grain size of the samples.