2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings 2006
DOI: 10.1109/icsict.2006.306072
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TCAD for Next Generation Technology and Product Development

Abstract: As the lithography-driven scaling has been replaced by physically-based scaling, TCAD has become a principal tool for virtual characterization of technology development. This paper describes roles, benefits, capabilities and perspectives of TCAD applications for technology and product development. Emerging challenges in the nanotechnology era are also discussed.

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