Techniques for Exploring Fine-Grained LUT and Routing Aging on a 28nm FPGA

Cook, Hayden; Goeders, Jeffrey

doi:10.1109/fpl64840.2024.00033

2024 34th International Conference on Field-Programmable Logic and Applications (FPL) 2024

DOI: 10.1109/fpl64840.2024.00033

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Techniques for Exploring Fine-Grained LUT and Routing Aging on a 28nm FPGA

Hayden Cook,

Jeffrey Goeders

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Techniques for Exploring Fine-Grained LUT and Routing Aging on a 28nm FPGA

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