Tem specimen heating during ion beam thinning: Microstructural instability

Kim, M.J.; Carpenter, R. W.

doi:10.1016/0304-3991(87)90031-3

Cited by 56 publications

(25 citation statements)

References 6 publications

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“…Conclusions from the present calculations and measurements are in accord with those of Kim and Carpenter [8]: peak sample temperatures of about 673 K can be reached during ion milling under usual conditions, and the most critical parameter is the aptitude of the sample holder legs to transfer the heat flowing from the beam into the sample.…”

Section: Resultssupporting

confidence: 88%

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Heating of TEM specimens during ion milling

Viguier

Mortensen

2001

Ultramicroscopy

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Sample heating during preparation of electron-thin specimens for observation in transmission electron microscopy (TEM) can produce artefacts which invalidate observations. This is particularly true of two-phase materials such as metal matrix composites, for which sample cooling with liquid nitrogen cannot be used to preserve the substructure during milling. A series of experiments is conducted using an age-hardenable aluminium alloy which produces a trace of peak temperature attained by TEM specimens during ion milling. It is shown that peak temperatures of the order of 650 K can be attained using conventional milling parameters; the technique must therefore be used with caution with materials such as metal matrix composites. A simplified one-dimensional heat transfer analysis of the problem is conducted to show that the most critical parameter is heat transfer along the sample holder legs and across interfaces along the heat path. Temperature differentials within the TEM specimen are shown to be less significant, yet these alone are capable of reaching 60 K within a dimpled specimen under usual milling conditions. #

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Section: Resultssupporting

confidence: 88%

“…Overall, experimental evidence available indicates that heating during ion milling under conditions (of beam intensity and angle) typical of metallographic thinning can indeed be significant [8][9][10][11][12].…”

Section: Introductionmentioning

confidence: 99%

Heating of TEM specimens during ion milling

Viguier

Mortensen

2001

Ultramicroscopy

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“…Sample heating by the ion milling has been a well-known phenomenon and many reported about related issues, loss of grain boundary segregation [5], micro-structural change [6,7], estimation of the temperature using low-meltingpoint metals [8], and measurement using temperature probe [9][10][11]. The operational manuals of ion-milling system provide only a rough estimate of the thermal power, which can be as much as 300 mW at a high milling rate [12].…”

Section: Introductionmentioning

confidence: 99%

Measurement and estimation of temperature rise in TEM sample during ion milling

Park

et al. 2007

Ultramicroscopy

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“…The inner ring marked with a n arrow is from NbA1, only. high local heating during ion milling can have important implications for sample preparation in other heat sensitive systems, and has also been reported by Kim and Carpenter (1987).…”

Section: Resultsmentioning

confidence: 85%

The preparation of cross‐sectional transmission electron microscopy specimens of Nb/Al multilayer thin films on sapphire substrates

Barmak

Rudman

Foner

1990

J. Elec. Microsc. Tech.

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We have developed a technique for preparation of cross-sectional transmission electron microscopy samples of reacted and unreacted Nb/Al multilayer thin films on sapphire substrates. The choice of substrate was found to be extremely important. Sapphire sputters more slowly than Nb and Nb-compounds and therefore makes it possible to obtain the electron transparent regions in the thin films rather than in the substrate. However, the brittle nature of the sapphire restricts the types of thinning techniques that can be used, requiring extensive ion thinning as a final stage.

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Tem specimen heating during ion beam thinning: Microstructural instability

Cited by 56 publications

References 6 publications

Heating of TEM specimens during ion milling

Heating of TEM specimens during ion milling

Measurement and estimation of temperature rise in TEM sample during ion milling

The preparation of cross‐sectional transmission electron microscopy specimens of Nb/Al multilayer thin films on sapphire substrates

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