1972
DOI: 10.1063/1.1660893
|View full text |Cite
|
Sign up to set email alerts
|

Temperature and frequency dependence of exchange anisotropy effects in oxidized NiFe films

Abstract: Hysteresis loops have been measured for thin NiFe films between 5 and 300 K using the magneto-optic Kerr effect. Films that are free of any surface oxide do not show a displacement of the easy-axis loop along the field axis, and the coercive force and anisotropy field are very weak functions of the temperature. Oxidized films show striking exchange anisotropy effects; displaced loops appear below a transition temperature ranging from 30 to 90 K as the film is more heavily oxidized. Loop width and anisotropy fi… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

4
32
0
2

Year Published

1973
1973
2015
2015

Publication Types

Select...
7
2

Relationship

0
9

Authors

Journals

citations
Cited by 78 publications
(38 citation statements)
references
References 14 publications
4
32
0
2
Order By: Relevance
“…Indeed, similar blocking temperatures around T ≈ 30 K have been previously found for naturally oxidized Py thin films [28]. The decreasing extent of the continuous reversal region with increasing temperature could be the result of the inhomogeneity and graininess of the oxide shell.…”
Section: Temperature Dependencesupporting
confidence: 51%
“…Indeed, similar blocking temperatures around T ≈ 30 K have been previously found for naturally oxidized Py thin films [28]. The decreasing extent of the continuous reversal region with increasing temperature could be the result of the inhomogeneity and graininess of the oxide shell.…”
Section: Temperature Dependencesupporting
confidence: 51%
“…The AFM sublattice orientation m then moves in the free-energy landscape determined by the crystalline anisotropy energy of the AFM and the exchange coupling to the FM. This situation has been analyzed by many authors [5,6] and provides a convincing qualitative description of the dissipation close to T Ã N or T B . However, mechanisms involving the AFM do not adequately explain the low-temperature degrees of freedom since none are independent of the CoO thickness.…”
Section: Article In Pressmentioning
confidence: 96%
“…[293]) and H e and T B are sizedependent, which is emphasized in this section. Besides, H e and T B are also functions of AFM orientation (compensated versus uncompensated AFM surface [298][299][300][301][302][303] and in-plane versus out-of-plane AFM spins [298,299,302]), of FM/AFM interface disorder (roughness [299,301,302,[304][305][306], crystallinity [307,308], grain size [309,310], of interface impurity layers [311]), and of strain effect [312][313][314], of stoichiometry [293] or of presence of multiple phases [315] and so forth.…”
Section: Exchange Bias In Fm/afm Heterostruc-turesmentioning
confidence: 99%