Temperature-Insensitive Soft-Error-Tolerant Flip-Flop Design For Automotive Electronics

Yee, Ralf E.-H.; Su, Nicholas Y.-J.; Wang, Lowry P.-T.; Wen, Charles H.-P.; Chiueh, Herming

doi:10.1109/vts60656.2024.10538664

2024 IEEE 42nd VLSI Test Symposium (VTS) 2024

DOI: 10.1109/vts60656.2024.10538664

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Temperature-Insensitive Soft-Error-Tolerant Flip-Flop Design For Automotive Electronics

Ralf E.-H. Yee,

Nicholas Y.-J. Su,

Lowry P.-T. Wang

et al.

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Temperature-Insensitive Soft-Error-Tolerant Flip-Flop Design For Automotive Electronics

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