2024
DOI: 10.3390/s24144438
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Temporal-Quality Ensemble Technique for Handling Image Blur in Packaging Defect Inspection

Guk-Jin Son,
Hee-Chul Jung,
Young-Duk Kim

Abstract: Despite achieving numerous successes with surface defect inspection based on deep learning, the industry still faces challenges in conducting packaging defect inspections that include critical information such as ingredient lists. In particular, while previous achievements primarily focus on defect inspection in high-quality images, they do not consider defect inspection in low-quality images such as those containing image blur. To address this issue, we proposed a noble inference technique named temporal-qual… Show more

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