Testing digital low-pass filters using oscillation-based test

Peretti, Gabriela; Romero, Eduardo; Marques, Carlos Alberto

doi:10.1016/j.micpro.2007.01.005

Cited by 5 publications

(2 citation statements)

References 39 publications

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“…OBT and OBIST have been applied to a wide variety of analogue and mixed-signal (AMS) CMOS circuits, including operational transimpedance amplifiers (OTAs) [28], [29] and OTA-based filters [30], second-generation current conveyors (CCIIs) [31] and CCII-based filters [32], conventional op-amps [33], switched capacitor filters [34], [35], digital circuits such as digital filters [36], full AMS blocks [37] and phase shifters [38].…”

Section: Introductionmentioning

confidence: 99%

Influence of PVT Variation and Threshold Selection on OBT and OBIST Fault Detection in RFCMOS Amplifiers

Nel

Dualibe

Stander

2023

IEEE Open J. Circuits Syst.

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Oscillation-based testing (OBT) and Oscillation-based built-in self-testing (OBIST) circuits enable detection of catastrophic faults in analogue and RF circuits, but both are sensitive to process, voltage and temperature (PVT) variation. This paper investigates 15 OBT and OBIST feature extraction strategies, and four approaches to threshold selection, by calculating figure-of-merit (FoM) across PVT variation. This is done using a 2.4 GHz LNA in 0.35 μm CMOS as DUT. Of the 15 feature extraction approaches, the OBT approaches are found more effective, with some benefit gained from switched-state detection. Of the four approaches to threshold selection (nominal-ranged static thresholds, extreme-range static thresholds, temperature dynamic thresholds, and simple noise-filtered tone detection), dynamic thresholds resulted in the highest average FoM of 0.919, with the best FoM of 0.952, with a corresponding probability of test escape P(TE) and yield loss P(YL) of 5•10 -2 and 1.89•10 -2 respectively but requires accurate temperature measurement. Extreme static threshold selection resulted in a comparable average FoM of 0.912, but with less susceptibility to process variation and without the need for temperature measurement. Binary detection of a noisefiltered oscillating tone is found the least complex approach, with an average FoM of 0.891.

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Section: Introductionmentioning

confidence: 99%

Influence of PVT Variation and Threshold Selection on OBT and OBIST Fault Detection in RFCMOS Amplifiers

Nel

Dualibe

Stander

2023

IEEE Open J. Circuits Syst.

View full text Add to dashboard Cite

show abstract

“…Multiplication has always been a hardware-, time-and powerconsuming arithmetic operation, especially for large-value operands. This bottleneck is even more emphasized in digital signal processing (DSP) applications that involve a huge number of multiplications [3,[6][7][8][12][13][14]18,20,22,25]. In many real-time DSP applications, speed is the prime target and achieving this may be done at the expense of the accuracy of the arithmetic operations.…”

Section: Introductionmentioning

confidence: 99%