The Dielectric Properties and Structure of Ni-Doped (0.8-x) PMT-0.2PZ-xPT Ternary System Near Morphotropic Phase Boundary

Abstract

Morphotropic phase boundary (MPB) of (0.8-x)PMT-xPbTiO 3 (PT)-0.2PbZrO 3 (PZ) ternary system (x = 0.4) was studied by X-ray diffraction (XRD). It shows that by comparing with 0.4PMT-0.2PZ-0.4PT sample, after doping with Ni, c/a remains almost same (about1.009), while both c and a decrease indicating that lattice shrinks. Content of the tetragonal phase TP% of Ni-doped samples increase up to 81.1% when the doping limit of the nickel is reached (y = 0.05), and the dielectric constant ε was found to increase up to 4570 when y = 0.05 and the Curie temperatures of doping samples were found to decrease from 175 • C to 157 • C.