The mixed potential plays a key role
in leaching of chalcopyrite.
Therefore, the impact of Fe2+ and Fe3+ on chalcopyrite
leaching was investigated in this work. Simultaneously, the chalcopyrite
passive film was studied by applying cyclic voltammetry (CV), potentiodynamic,
potentiostatic, and Tafel polarization. X-ray photoelectron spectroscopy
(XPS) was used to analyze the products formed during the electrochemical
treatment of chalcopyrite. Furthermore, the band theory was used to
analyze the oxidation and reduction of chalcopyrite. High copper extraction
percentage was obtained at a low mixed potential or ratio of Fe3+/Fe2+. The empty states of chalcopyrite overlapped
with filled states of Fe2+; chalcopyrite captured electrons
from Fe2+ and was reduced to chalcocite, which was very
easily oxidized by Fe3+. The Fe dissolves preferentially
from the chalcopyrite surface in the potential range from 475 to 700
mV and leave behind a S2
2– and S
n
2– passive film. The chalcopyrite
transpassive dissolution occurs above 700 mV.