2006
DOI: 10.1016/j.jcrysgro.2006.06.042
|View full text |Cite
|
Sign up to set email alerts
|

The epitaxial lateral overgrowth of silicon by two-step liquid phase epitaxy

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

1
6
0

Year Published

2008
2008
2015
2015

Publication Types

Select...
2
2
2

Relationship

0
6

Authors

Journals

citations
Cited by 7 publications
(7 citation statements)
references
References 14 publications
1
6
0
Order By: Relevance
“…3-4 lm). The data presented above are in good agreement with our previous results [4][5][6]. What is interesting, the layers grown in an H 2 atmosphere inherit more defects from the growth substrate than these grown under Ar (5.26 Â 10 5 and 3.45 Â 10 5 cm À2 , respectively).…”
Section: Type Of Ambient Gassupporting
confidence: 91%
See 2 more Smart Citations
“…3-4 lm). The data presented above are in good agreement with our previous results [4][5][6]. What is interesting, the layers grown in an H 2 atmosphere inherit more defects from the growth substrate than these grown under Ar (5.26 Â 10 5 and 3.45 Â 10 5 cm À2 , respectively).…”
Section: Type Of Ambient Gassupporting
confidence: 91%
“…The choice of mask kinds and silicon windows orientation was based on our previous experiments [13]. As was observed, in the case of h0 11i windows orientation, the lateral crystallization front was aligned to the seeding lines, while in the case of the h2 1 1i orientation of seeding lines the crystallization did not occur in a plane-parallel manner with respect to the direction mentioned, but the layers achieved a higher aspect ratio in the same conditions of growth [13,16,17].…”
Section: Methodsmentioning
confidence: 99%
See 1 more Smart Citation
“…1(a)) in comparison to the results of growth in an H 2 atmosphere ( Fig. 1(b)) [4]. It is very common that silicon LPE growth occurs from Sn-Si solutions, therefore, such system has been investigated in this work.…”
Section: Introductionmentioning
confidence: 91%
“…SCS cannot be grown directly on a sacrificial layer due to lattice constant mismatch. However, if contacts to underlying SCS layer (or deeper to the substrate) are etched a well-controlled SCS layer can grow starting from the contact spot in the Epitaxial Lateral Overgrowth (ELO) process 34 . The new layer preserves the same crystallographic characteristics as the parent layer.…”
Section: Single Wafer Approachmentioning
confidence: 99%