The IEEE Technical Committee 10-The Waveform Generation, Measurement, and Analysis Committee: Update 2021

Vito, Luca De; Jendzurski, John R.; Rapuano, Sergio; Boyer, W.B.; Blair, Jerome; Paulter, Nicholas G.

doi:10.1109/mim.2022.9908270

Cited by 3 publications

(1 citation statement)

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“…In reality, standardization activities of characterization procedures are not operative hitherto, since AICs are not commercial devices yet. Anyway, a standardization initiative can be undertaken within the “Technical Committee 10—Waveform Generation, Measurement & Analysis” of the IEEE Instrumentation and Measurement Society [ 38 ].…”

Section: Metrological Characterization In Aicsmentioning

confidence: 99%

Over the Limits of Traditional Sampling: Advantages and Issues of AICs for Measurement Instrumentation

Iadarola

Daponte

Vito

et al. 2023

Sensors

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Data acquisition systems have shown the need of wideband spectrum monitoring for many years. This paper describes and discusses a recently proposed architecture aimed at acquiring efficiently wideband signals, named the Analog-to-Information Converter (AIC). AIC framework and working principle implementing the sub-Nyquist sampling are analyzed in general terms. Attention is specifically focused on the idea of exploiting the condition of the signals that, despite their large bandwidth, have a small information content in the frequency domain. However, as clarified in the paper, employing AICs in measurement instrumentation necessarily entails their characterization, through the analysis of their building blocks and the corresponding non-idealities, in order to improve the signal reconstruction.

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Section: Metrological Characterization In Aicsmentioning

confidence: 99%