The Impact of Pulsed Electromagnetic Fault Injection on True Random Number Generators

Madau, Maxime; Agoyan, Michel; Balasch, Josep; Grujić, Miloš; Haddad, Patrick; Maurine, Philippe; Rožić, Vladimir; Singelée, Dave; Yang, Bohan; Verbauwhede, Ingrid

doi:10.1109/fdtc.2018.00015

Cited by 9 publications

(4 citation statements)

References 9 publications

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“…• Stuck-at faults permanently changes the value of the stored data into some other value. SIFA can be used with this fault model [4], and also, true random number generators (TRNGs) can be biased by using stuck-at faults [76].…”

Section: Current State-of-the-art Techniques and Their Practicalitymentioning

confidence: 99%

How Practical Are Fault Injection Attacks, Really?

Breier

Hou

2022

IEEE Access

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Fault injection attacks (FIA) are a class of active physical attacks, mostly used for malicious purposes such as extraction of cryptographic keys, privilege escalation, attacks on neural network implementations. There are many techniques that can be used to cause the faults in integrated circuits, many of them coming from the area of failure analysis. In this paper we tackle the topic of practicality of FIA. We analyze the most commonly used techniques that can be found in the literature, such as voltage/clock glitching, electromagnetic pulses, lasers, and Rowhammer attacks. To summarize, FIA can be mounted on most commonly used architectures from ARM, Intel, AMD, by utilizing injection devices that are often below the thousand dollar mark. Therefore, we believe these attacks can be considered practical in many scenarios, especially when the attacker can physically access the target device.INDEX TERMS Hardware security, fault injection attacks, fault analysis, cryptography.

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Section: Current State-of-the-art Techniques and Their Practicalitymentioning

confidence: 99%

How Practical Are Fault Injection Attacks, Really?

Breier

Hou

2022

IEEE Access

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“…They showed localized effects of the fault injection, and hence, the countermeasure, which was a timing violation detection circuit, was shown to not be consistently effective [46]. Madau et al used EM-induced faults to attack a true random number generator, as a first step to overcoming the masking countermeasures for cryptographic cores [129].…”

Section: Hardware Fault Injectionmentioning

confidence: 99%

Electrical-Level Attacks on CPUs, FPGAs, and GPUs: Survey and Implications in the Heterogeneous Era

Mahmoud

Lenders²,

Stojilović

2022

ACM Comput. Surv.

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Given the need for efficient high-performance computing, computer architectures combining central processing units (CPUs), graphics processing units (GPUs), and field-programmable gate arrays (FPGAs) are currently prevalent. However, each of these components suffers from electrical-level security risks. Moving to heterogeneous systems, with the potential of multitenancy, it is essential to understand and investigate how the security vulnerabilities of individual components may affect the system as a whole. In this work, we provide a survey on the electrical-level attacks on CPUs, FPGAs, and GPUs. Additionally, we discuss whether these attacks can extend to heterogeneous systems and highlight open research directions for ensuring the security of heterogeneous computing systems in the future.

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“…Both the DC-TRNG and the ES-TRNG are highly portable, thanks to their fully digital architecture and availability of the delay chains in most commercial FPGAs [4,16]. The DC-TRNG is resistant to EM fault attacks [7] and can reliably operate across a broad temperature range. Additionally, it possesses stochastic model and achieves relatively high throughput with low design effort and stringent security guarantees.…”

Section: Case Study: Delay Chain Based Trngsmentioning

confidence: 99%

Design Principles for True Random Number Generators for Security Applications

Grujić

Rožić

Johnston

et al. 2019

Proceedings of the 56th Annual Design Automation Conference 2019

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The generation of high quality true random numbers is essential in security applications. For secure communication, we also require high quality true random number generators (TRNGs) in embedded and IoT devices. This paper provides insights into modern TRNG design principles and their evaluation, based on standard's requirements and design experience. We illustrate our approach with a case study of a recently proposed delay chain based TRNG.

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The Impact of Pulsed Electromagnetic Fault Injection on True Random Number Generators

Cited by 9 publications

References 9 publications

How Practical Are Fault Injection Attacks, Really?

How Practical Are Fault Injection Attacks, Really?

Electrical-Level Attacks on CPUs, FPGAs, and GPUs: Survey and Implications in the Heterogeneous Era

Design Principles for True Random Number Generators for Security Applications

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