2024 International Conference on the Frontiers of Electronic, Electrical and Information Engineering (ICFEEIE) 2024
DOI: 10.1109/icfeeie64494.2024.00016
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The Impact of Trap Evolution Caused by Pulse Stress on the Electrical Characteristics of the Device

Yi Huang,
Chunsheng Guo,
Shiwei Feng
et al.
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