The influence of substrate temperature on the morphology, optical and electrical properties of thermal-evaporated ZnTe Thin Films

Microstructure and optical studies of electron beam evaporated ZnSe1−xTex nanocrystalline thin films

“…Finally, for ZnTe film three diffraction peaks are observed for planes (1 1 1), (2 2 0) and (3 1 1), respectively. These observations agree very well with the previous reported results for ZnSe, ZnTe and their mixed compounds [11,[24][25][26]. The lattice con- stant, a, of the unit cell of the as-deposited films was determined from the following relation:…”

Optical characterization of polycrystalline ZnSe1−xTex thin films using variable angle spectroscopic ellipsometry and spectrophotmetery techniques

“…X-ray diffraction spectra of ZnSe, ZnTe powder and a simulate scan for both in terms of Rietveld refinement according to ZnSe and ZnTe cards using X'Pert HighSore (version 1.0e) program. plane, note that the (2 2 2) peak is magnified (800 times) and is not plotted to same scale as peak (1 1 1) [23]. The intensity of the two extra diffraction peaks (2 2 0) and (3 1 1) increases by further increasing of tellurium content into ZnSe matrix, indicating good crystallinity of the films.…”

On the mechanism of current-transport in Cu/CdS/SnO2/In–Ga structures

“…caused by deviation of CdS composition from the stoichiometry. Recently, semiconductor nanostructures have gained considerable importance because of their unusual optical, electrical and device applications [7][8][9][10][11].…”