2005
DOI: 10.1016/j.nimb.2005.01.027
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The Lund Nuclear Microprobe sub-micron set-up. Part II: Beam line, focusing system and scanning

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Cited by 30 publications
(8 citation statements)
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“…Therefore, a second set of experiments was conducted, at Lund University Nuclear Microprobe Laboratory, using µ‐particle induced X‐ray emission (µ‐PIXE) to assess the distribution of these macronutrients. This microbeam line (Shariff et al ., 2005; Elfman et al ., 2005) uses a 3 MV single‐ended electrostatic accelerator (NEC), a two‐stage magnetic quadrupole doublet focusing lens system (Oxford OM‐52, Oxford Microbeam OM‐52, Oxford, UK) and an annular eight element Germanium X‐ray array detector (Canberra, Meriden, CT, USA) for PIXE measurements (Shariff et al ., 2004). A proton beam of 2.5 MeV was focused to a spot size of c .…”
Section: Methodsmentioning
confidence: 99%
“…Therefore, a second set of experiments was conducted, at Lund University Nuclear Microprobe Laboratory, using µ‐particle induced X‐ray emission (µ‐PIXE) to assess the distribution of these macronutrients. This microbeam line (Shariff et al ., 2005; Elfman et al ., 2005) uses a 3 MV single‐ended electrostatic accelerator (NEC), a two‐stage magnetic quadrupole doublet focusing lens system (Oxford OM‐52, Oxford Microbeam OM‐52, Oxford, UK) and an annular eight element Germanium X‐ray array detector (Canberra, Meriden, CT, USA) for PIXE measurements (Shariff et al ., 2004). A proton beam of 2.5 MeV was focused to a spot size of c .…”
Section: Methodsmentioning
confidence: 99%
“…A scanning beam produces maps of concentrations of selected elements in the sample, over an active area of 50 mm 2 , by the use of the Particle Induced X-ray Emission (PIXE) method. Detailed information about the Lund NMP facility and methods applied was presented by Shariff et al (2005aShariff et al ( , 2005b and Elfman et al (2005). NMP scanning conditions were described by Elfman et al (1999) and Limburg et al (2001).…”
Section: Methodsmentioning
confidence: 99%
“…The main features of the facility have been described previously in e.g. [14, 15]. When, as in this case, running the accelerator (which is designed for 3000 keV) at energies below 1000 keV, one section of the machine needs to be electrically shortcut to optimize the ion beam optics and the stability of the accelerator.…”
Section: Methodsmentioning
confidence: 99%