2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) 2018
DOI: 10.1109/ipfa.2018.8452494
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The OTP Data Retention Improvement on CESL and SAB Film Scheme

Bo-An Tsai
1
,
Sung-Keun Chang
2
,
Chin-Hsiang Ho
3
et al.
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