Abstract:The paper presents results of electrical breakdown time delay mean value t?d
as a function of relaxation time ? (memory curve) for krypton and
xenon-filled diodes at 270 Pa pressure. Memory curves were obtained for the
cases without radiation as well as in the presence of gamma and UV
radiation. It was shown that significant influence of UV radiation to t?d can
be observed for ? ? 100 ms, as well as gamma radiation for ? ? 103 ms.
Laue's distribution was also investigated for electrical bre… Show more
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