The Preparation of High Saturation Magnetization and Low Coercivity Feco Soft Magnetic Thin Films via Controlling the Thickness and Deposition Temperature

Abstract

FeCo thin films with high saturation magnetization (4 pMs) can be applied in high-frequency electronic devices such as thin film inductors and microwave noise suppressors. However, due to its large magnetocrystalline anisotropy constant and magnetostrictive coefficient of FeCo, the coercivity (Hc) of FeCo films is generally high, which is detrimental to the soft magnetic properties. Meanwhile, the thickness and deposition temperature have significant effects on the coercivity and saturation magnetization of FeCo films. In this paper, FeCo thin films with different thicknesses were prepared by magnetron sputtering at different temperatures. The effects of thickness and deposition temperature on the microstructure and magnetic properties of FeCo thin films were systematically studied. When the film thickness increases from 50 nm to 800 nm, the coercivity would decrease from 309 Oe to 160 Oe. However, the saturation magnetization decreases from 22.1 kG to 15.3 kG. After that, we try to further increase the deposition temperature from room temperature (RT) to 475 °C. It is intriguing to find that the coercivity greatly decreased from 160 Oe to 3 Oe (decreased by 98%), and the saturation magnetization increased from 15.3 kG to 23.5 kG (increased by 53%) for the film with thickness of 800 nm. For the film with thickness of 50 nm, the coercivity also greatly decreased from 309 Oe to 10 Oe (decreased by 96%), but the saturation magnetization did not change significantly. It is contributed to the increase of deposition temperature, which will lead to the increase of grain size and the decrease of the number of grain boundaries. And the coercivity decreases as the number of grain boundaries decreases. Meanwhile, for the thicker films, when increasing the deposition temperature the thermal stress increases, which changes the appearance of (200) texture, and the saturation magnetization increases. Whereas, it has a negligible effect on the orientation of thin films with small thickness (50 nm). This indicates that high-temperature deposition is beneficial to the soft magnetic properties of FeCo thin films, particularly for the films with larger thickness. This FeCo thin film with high saturation magnetization and low coercivity could be an ideal candidate for high-frequency electronic devices.

Special Issue: “Soft Magnetic Materials and Their Applications”

“…High saturation magnetization and low coercivity FeCo soft magnetic thin films with different thicknesses were prepared via magnetron sputtering by controlling the thickness and deposition temperature in a paper by Yang et al [ 4 ]. This FeCo thin film with high saturation magnetization and low coercivity could be an ideal candidate for high-frequency electronic devices.…”

Joint Resonance Analysis in Multiple Modes of Soft Ferromagnetic Rectangular Thin Plate

“…Soft magnetic materials (SMMs) [27], mainly manifested as magnetization, their coercivity is less than 1000 A/m. For soft magnetic materials, the use of limited external magnetic fields can maximize the magnetization strength, because it has low coercivity and high permeability [28,29], which can meet the requirements of miniaturization, lightweight, energy saving, and high frequency of materials put forward by new eco-gnomic forms. As an object of soft magnetic materials, soft ferromagnetism has great research value in its material properties.…”

Influence of the Substrate on the Exchange Coupling of NiO/FeCo Bilayers

“…In this work, we focus our study on the effects induced by the substrate on the exchange coupling properties of epitaxial NiO/FeCo bilayers deposited on both MgO (001) and Al 2 O 3 (0001) substrates. Among the 3d ferromagnets with a BCC structure, FeCo was chosen as the F layer because of its soft magnetic behavior with the highest magnetic moment [17]. Most of the works on metallic NiO/F hybrid systems are concentrated on Fe and permalloy [18][19][20] as the F layer.…”