“…2) On the other hand, thanks to the development of micromachining technique of focused ion beam (FIB) milling, tiny test samples with diameters from a few micrometers down to a few hundred nanometers became available. Since the pioneering research by Uchic, Dimiduk, Florando and Nix 3) on the compression experiments in 2004 on micropillar samples of Ni and Ni 3 AlTa single crystals with the diameter from 0.5 to a few tens of micrometers, produced by the FIB milling process, mechanical tests on FIB processed submicron sized specimens became quite popular: from 2005 to 2020, the target crystals were mainly face-centered-cubic (FCC) single crystals of Au, 4) Ni, 5) Cu 6) and Al, 7) and from 2007 to 2019, body-centered-cubic (BCC) single crystals of Mo, 8,9) W, Mo and Nb, 10) W, Mo, Ta and Nb, 11) V, 12) Fe 13,14) and Fe, Nb, and V, 15) commonly with the ©100ª axial orientation, and also hexagonal-close-packed metals of Ti 16) and Mg 17) and some intermetallic compounds. An important difference between grown whisker crystals and nano-sized crystals fabricated by the FIB milling process is that in contrast to almost dislocation free whisker wires, FIB milling processed micro-pillars contain rather high density of dislocations of the order of 10 13 m ¹2 18) which are most probably introduced as the damage of FIB milling.…”