The Solution for the Thermographic Measurement of the Temperature of a Small Object

Abstract

This article describes the measuring system and the influence of selected factors on the accuracy of thermographic temperature measurement using a macrolens. This method enables thermographic measurement of the temperature of a small object with an area of square millimeters as, e.g., electronic elements. Damage to electronic components is often preceded by a rise in temperature, and an effective way to diagnose such components is the use of a thermographic camera. The ability to diagnose a device under full load makes thermography a very practical method that allows us to assess the condition of the device during operation. The accuracy of such a measurement depends on the conditions in which it is carried out. The incorrect selection of at least one parameter compensating the influence of the factor occurring during the measurement may cause the indicated value to differ from the correct value. This paper presents the basic issues linked to thermographic measurements and highlights the sources of errors. A measuring stand which enables the assessment of the influence of selected factors on the accuracy of thermographic measurement of electronic elements with the use of a macrolens is presented.

Thermographic Measurement of the Temperature of Reactive Power Compensation Capacitors

“…Reflected temperature ϑ refl is also called reflected radiation [32] in the literature. It is the radiation emitted by an object that is in the vicinity of the object under observation.…”

“…Reflected temperature ϑrefl is also called reflected radiation [32] in the literatu the radiation emitted by an object that is in the vicinity of the object under obse The reflected radiation reaches the lens of the thermographic camera together w radiation emitted by the object under observation. There is no mathematical mo would accurately describe the value of ϑrefl in every case.…”

The Estimated Temperature of the Semiconductor Diode Junction on the Basis of the Remote Thermographic Measurement

“…These inconveniences can be prevented by using thermography. This noncontact method allows for measuring the junction temperature on the basis of the power of IR radiation (InfraRed) reaching the IR radiation detectors [ 15 ]. With the radiation emitted by the observed case, the lens of the IR camera is reached by the radiation from neighboring objects and radiation emitted by the air layer located between the lens and the case of the electronic component.…”

Indirect Thermographic Temperature Measurement of a Power-Rectifying Diode Die

“…One of the semiconductor elements used to build high-power converter systems is a rectifying diode. The operation of the diode using the properties taken into account during the design process determines the correct operation of the converter system [8]. The most commonly used materials for the production of power diodes are silicon (Si) [9] and silicon carbide (SiC) [10].…”