2012
DOI: 10.1103/physrevb.85.033305
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Thickness and strain effects on electronic structures of transition metal dichalcogenides: 2H-MX2semiconductors (M=Mo, W;

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Cited by 1,228 publications
(653 citation statements)
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“…Increase in the in-plane lattice constant by ∆a leads to reduction of direct and indirect transition energies at a different rate (Figure 2a and d) in agreement with the previous studies 16,18,19,24,30,31 . The changes are more pronounced for transitions involving the K point.…”
Section: Resultssupporting
confidence: 92%
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“…Increase in the in-plane lattice constant by ∆a leads to reduction of direct and indirect transition energies at a different rate (Figure 2a and d) in agreement with the previous studies 16,18,19,24,30,31 . The changes are more pronounced for transitions involving the K point.…”
Section: Resultssupporting
confidence: 92%
“…This behavior was predicted by calculations 7,[16][17][18][20][21][22] and confirmed in early photoemission experiments on WS 2 monolayer grown by van der Waals epitaxy 23 . Similarly, the conduction band valley at the Λ point (midpoint between K and Γ) shifts downward in the presence of interlayer interaction as indicated by calculations 7,16,17,[20][21][22] . In contrast, the states near the K point are comparatively less susceptible to the number of layers 4,7,9,10 .…”
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confidence: 67%
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“…For a 0° twist angle, charge loss affects the Mo-S bond length; for a 30° twist angle, on the other hand, it is predicted that charge loss of the Mo-S bond is absent because graphene has a different registry with respect to the S atoms for this orientation [21]. Note that comprehensive DFT calculations have shown that band structure of monolayer MoS 2 is significantly affected by bond length variation [40]. Similarly, Wang et al attribute the twist-angle dependence of the MoS 2 band structure to strain, and they too mention the presence of charge redistribution at the interface [22].…”
mentioning
confidence: 99%