2019
DOI: 10.12693/aphyspola.136.432
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Thickness and Temperature Dependence of ZnO/Glass Thin Film Systems Obtained by Thermal Evaporation

Abstract: In this study, the effects of annealing temperature and thickness on zinc oxide formation in ZnO/glass thin film systems were investigated. For this purpose, ZnO thin films with thicknesses of 150-300 nm were obtained by thermal evaporation and then annealed in a range of 200-400 • C in air. The structural, optical, and electrical characterizations of ZnO/glass films were obtained. According to structural investigations, the deposited films contain Zn rich phases due to low oxygen content. By increasing the an… Show more

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Cited by 1 publication
(2 citation statements)
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“…The explanation for the growth of ZnO films lies in the VS mechanism . As we know, the melting point of Zn is 419.5 °C.…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…The explanation for the growth of ZnO films lies in the VS mechanism . As we know, the melting point of Zn is 419.5 °C.…”
Section: Resultsmentioning
confidence: 99%
“…The explanation for the growth of ZnO films lies in the VS mechanism. 20 As we know, the melting point of Zn is 419.5 °C. Thus, when the oxidation temperature exceeds the melting point of Zn metal, the Zn films gradually melt into Zn droplets, which react with adsorbed oxygen to produce ZnO droplets.…”
Section: Characterization Of Ag-loaded Znomentioning
confidence: 99%