Thickness dependent anomalous magnetic behavior in pulsed-laser deposited cobalt ferrite thin film

Strain-tunable magnetic properties of epitaxial lithium ferrite thin film on MgAl2O4 substrates

“…The in-plane compressive strain (or out-of-plane tensile strain) induced in-plane (or out-of-plane) magnetization enhancement (or decrease), which is also observed in other similar negative magnetostrictive spinel ferrimagnetic systems like zinc ferrite and cobalt ferrite published in recent years. 26,28,29 Moreover, it can be clearly seen that the coercivity increases with increasing the thickness (shown in the bottom graph of Fig. 4b).…”

“…Therefore, we can rule out the possibility of cation redistributions between A and B sites, and some Fe rich regions in the ultra-thin layer that may cause variations of magnetic properties in ferrite films. 17,[25][26][27] The most likely factor of tuning the magnetic properties in our system should be the interface strain due to lattice misfit between LFO film and the MAO substrate.…”

Pulsed laser deposited CoFe2O4 thin films as supercapacitor electrodes

“…Among them, the ve Raman active modes are A 1g , E g , and 3T 2g . 35,36 The modes below (above) 600 cm À1 are attributed to the oxygen motion around the octahedral (tetrahedral) lattice sites. 37 The broadening of the Raman modes indicating its amorphous nature is in agreement with the XRD results.…”

Epitaxial Lift‐Off of Centimeter‐Scaled Spinel Ferrite Oxide Thin Films for Flexible Electronics

“…The magnetic domain configuration of the transferred LFO thin films (Figure c) revealed by magnetic force microscopy (MFM) is similar to that of the as‐grown thin films (Figure d), while the domain size in the transferred films is a little larger than that of the as‐grown thin films. These phenomena might be the result of the partially released in‐plane compressive strain in the transferred film (Figure S2, Supporting Information), which decreases the magnetoelastic energy in the transferred LFO films . To probe the reliability of the transferred LFO for flexible devices, bending cycling test has been taken on the 24‐ and the 300‐nm‐thick samples.…”