Thin Layer Method For LA-ICP-MS Analysis Of Trace Elements Concentrates Of Germanium Dioxide

Abstract

A combination of trace elements preconcentration and laser ablation inductively coupled plasma mass spectrometry (LA-ICP-MS) is proposed for the analysis of high purity substances. The analytical figures of merit of this combination were evaluated using high purity germanium dioxide as an example. Trace elements were preconcentrated by germanium volatization in the form of germanium tetrachloride from sample solutions. The trace elements concentrate was evaporated to dryness on the surface of a high-purity silicon substrate and analyzed by LA-ICP-MS. Indium was used as an internal standard to obtain quantitative data. Limits of detection (LODs) for 47 trace elements are in the range from 0.3 to 300 ppt wt (0.3 to 300 pg g -1 ). The obtained LODs are 10-100 times lower compared to ICP-MS analysis of germanium with preconcentration of trace elements. The accuracy of results was confirmed by comparing with results obtained by the traditional ICP-MS analysis of the trace elements concentrates and by the "spike" experiments.