Time Domain Coupling Analysis of the Transmission Line Excited by the Leakage EM Fields from the Integrated Circuit with Shielded Enclosure

Abstract

At present, numerical methods suitable for the electromagnetic interference (EMI) analysis of the transmission line (TL) excited by the leakage electromagnetic (EM) fields generated by the integrated circuit (IC) of the electronic device are still rare. An efficient time domain hybrid method, consisting of the dynamic differential evolution (DDE) algorithm, transmission line equations, finite difference time domain (FDTD) method, and nonuniform grid technique, is presented to realize the fast simulation of leakage EM fields to the TL. Firstly, a source reconstruction method based on the DDE algorithm is employed to extract the equivalent dipole array to represent the leakage EM radiation from the IC of the device. Then, the coupling model of the TL excited by the leakage EM fields is constructed by the TL equations and nonuniform grid technique, and solved by the FDTD method to realize the synchronous calculation of the leakage EM field radiation and the transient responses on the TL. Finally, the correctness of the source reconstruction method has been tested, and the accuracy and efficiency of the proposed method have been verified via two simulation cases of the transmission line excited by leakage EM fields arising from IC in free space and shielded enclosure by comparing with that of the MOM method.