“…1). An Indian patent was given for insect probe trap, pitfall trap, and stack probe as TNAU patents (Mohan, 2007;Mohan, 2010;Mohan and Rajesh, 2016;Banga et al, 2018). Therefore, the spatial distribution of these traps from the top passing the middle to the bottom layers of kernel stacks in the warehouse could be a better guide for the timely control of warehoused pests (Fig.…”