Total Ionizing Dose and Radiation Particle Strike Analysis of Nanoscale FinFET Devices and Circuits

Spoorthi, Ch.; Grace, Jessy; Chavan, Ameet; Rao, Chinnam Sv Maruthi

doi:10.1109/iceca49313.2020.9297573

2020 4th International Conference on Electronics, Communication and Aerospace Technology (ICECA) 2020

DOI: 10.1109/iceca49313.2020.9297573

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Total Ionizing Dose and Radiation Particle Strike Analysis of Nanoscale FinFET Devices and Circuits

Ch. Spoorthi¹,

Jessy Grace²,

Ameet Chavan³

et al.

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Total Ionizing Dose and Radiation Particle Strike Analysis of Nanoscale FinFET Devices and Circuits

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References 20 publications

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