Total reflection X-ray fluorescence analysis of light elements using synchrotron radiation

Streli, Christina; Wobrauschek, P.; Ladisich, W.; Rieder, R.; Aiginger, H.; Ryon, Richard W.; Pianetta, P.

doi:10.1016/0168-9002(94)91019-7

Cited by 24 publications

(6 citation statements)

References 19 publications

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“…The Atominstitut group started their experiments also in 1993 at Beamline III-4 and investigated in the following years the spectral distribution and geometries. [25][26][27] The best suitable beamline at SSRL turned out to be the bending magnet beamline BL 3-3 in combination with a multilayer monochromator. Details of the setup can be found in ref.…”

Section: Historical Reviewmentioning

confidence: 99%

Synchrotron radiation induced TXRF

Streli

Wobrauschek

Meirer

et al. 2008

J. Anal. At. Spectrom.

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The use of synchrotron radiation (SR) as an excitation source for total reflection X-ray fluorescence analysis (TXRF) offers several advantages over X-ray tube excitation. Detection limits in the fg range can be achieved with efficient excitation for low Z as well as high Z elements due to the features of synchrotron radiation and in particular the high brilliance in a wide spectral range and the linear polarization in the orbital plane. SR-TXRF is especially interesting for samples where only small sample masses are available. Lowest detection limits are typically achieved using multilayer monochromators since they exhibit a bandwidth of about 0.01 DE/E. Monochromators with smaller bandwidth like perfect crystals, reduce the intensity, but allow X-ray absorption spectroscopy (XAS) measurements in fluorescence mode for speciation and chemical characterisation at trace levels. SR-TXRF is performed at various synchrotron radiation facilities. An historical overview is presented and recent setups and applications as well as some critical aspects are reviewed.

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Section: Historical Reviewmentioning

confidence: 99%

Synchrotron radiation induced TXRF

Streli

Wobrauschek

Meirer

et al. 2008

J. Anal. At. Spectrom.

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“…Consequently, the differences in spectral characteristics are reected in the varying quantication capabilities of these distinct X-ray sources. [9][10][11][12] Nevertheless, both types of excitation sources, X-ray tube and SR, induce the emission of the characteristic XRF radiation in the same way. In fact, the number of induced XRF photons resulting from excitation by an X-ray tube and by SR may be described by the same relationship incorporating experimental, instrumental, and atomic fundamental parameters (FPs).…”

Section: Introductionmentioning

confidence: 99%

Reference-free X-ray fluorescence analysis using well-known polychromatic synchrotron radiation

Wählisch

Wansleben

Unterumsberger

et al. 2023

J. Anal. At. Spectrom.

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“…One of the ways to improve the detection limit of TXRF analysis is to use more powerful x-ray sources, such as a rotating anode x-ray generator and synchrotron radiation. 4,5 Synchrotron radiation is a promising source; however, availability is one of the problems.…”

Section: Introductionmentioning

confidence: 99%

Preliminary experiment of total reflection x-ray fluorescence using two glancing x-ray beams excitation

Tsuji

Sato

Wagatsuma

et al. 1999

Review of Scientific Instruments

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In conventional total reflection x-ray fluorescence ͑TXRF͒, one glancing x-ray beam irradiates the sample carrier for excitation of x-ray fluorescence. However, it is also possible to excite x-ray fluorescence by multiple x-ray beams. We performed a preliminary TXRF experiment excited by two independent glancing x-ray beams. The two x-ray beams excitation would be effective to enhance the intensity of x-ray fluorescence and to improve the detection limit in TXRF. X rays from both a rotating Mo anode x-ray tube and a glow discharge x-ray tube with an Fe target irradiated a Cr thin film sample on a quartz glass. The x-ray fluorescence of Cr K␣ from the sample was slightly enhanced compared with the intensity measured by one x-ray beam excitation.

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Total reflection X-ray fluorescence analysis of light elements using synchrotron radiation

Cited by 24 publications

References 19 publications

Synchrotron radiation induced TXRF

Synchrotron radiation induced TXRF

Reference-free X-ray fluorescence analysis using well-known polychromatic synchrotron radiation

Preliminary experiment of total reflection x-ray fluorescence using two glancing x-ray beams excitation

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