Towards Optimized Multi-Channel Modulo-ADCs: Moduli Selection Strategies and Bit Depth Analysis

Abstract

This paper presents a theoretical analysis of multi-channel modulo analog-to-digital converters (ADCs) for high-dynamic range sampling under bounded noise. In particular, we derive the maximum error tolerance in terms of ADC dynamic range, signal dynamic range, and channel number. Additionally, we present closed-form expressions for ADC thresholds, ensuring near-optimal error resilience, and analyzing the minimal bit-depth needed for stable recovery. Compared to single-channel modulo ADCs, our approach achieves superior error tolerance with reduced sampling rates. Moreover, it demands a minor bit rate increase compared to conventional ADCs but operates with a significantly smaller ADC dynamic range.