Tunneling microscopy from 300 to 4.2 K

Elrod, Scott; Bryant, Astra S.; Lozanne, Alex de; Park, S; Smith, D. P. E.; Quate, C. F.

doi:10.1147/rd.304.0387

Cited by 29 publications

(5 citation statements)

References 1 publication

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“…Quate's group with the 1&&1 structure on Pt(100) (Elrod et al , 1986), and J. Behm, W. Hoesler, and E. Ritter with the hexagonal phase on Pt(100) . At the American Physical Society March meeting in 1985, P. Hansma presented STM images of graphite structures of atomic dimensions (Hansma, 1985), and when J.…”

Section: Fig 2 the Principle The Tunneling Transmittivity Decreasesmentioning

confidence: 99%

Scanning tunneling microscopy—from birth to adolescence

1987

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We present here the historic development of Scanning Tunneling Microscopy (STM); the physical and technical aspects have already been covered in a few recent reviews and two conference proceedings' and many others are expected to follow in the near future. A technical summary is given by the sequence of figures, which stands alone. Our narrative is by no means a recommendation of how research should be done; it simply reflects what we thought, how we acted, and what we felt. However, it would certainly be gratifying if it encouraged a more relaxed attitude towards doing science. Perhaps we were fortunate in having common training in superconductivity,

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Section: Fig 2 the Principle The Tunneling Transmittivity Decreasesmentioning

confidence: 99%

Scanning tunneling microscopy—from birth to adolescence

1987

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“…This high force is related to the large corrugation observed in STM imaging of graphite [21] and more generally to the anomalous barrier heights obtained in STM experiments performed under ambient conditions, where the surface is not sufficiently clean. [22] In addition to the experiments on HOPG, we performed the measurement on Au substrates. For this purpose we used the gold film that is covering the nanotube ends.…”

mentioning

confidence: 99%

Mechanical and Electrical Properties of Nanosized Contacts on Single-Walled Carbon Nanotubes

et al. 2000

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Carbon nanotubes are very promising candidates for molecular wires, and as such it is important to understand their electrical and mechanical properties. Here single‐walled carbon nanotubes (SWNTs) are investigated using non‐contact dynamic scanning force microscopy (SFM). The nanotubes are locally probed using metallized cantilever tips to correlate the mechanical and electrical properties, and the simultaneously obtained force vs. distance and current vs. distance curves are compared. The measurements reveal that electrical contact occurs for very small load forces.

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“…No atomic corrugation was ever observed on our Pt surfaces though with the same tips we did observe atomic corrugation on a graphite surface. Atomic corrugation has been observed on an Au(lll) surface by Hallmark et al (1987) and on Pt(100) by Elrod and co-workers (Elrod, Bryant, de Lozanne, Park, Smith & Quate, 1986). One reason for our inability to observe atomic corrugation on the Pt thin film is the presence of a contamination and/or oxide layer on the Pt surface.…”

Section: Discussionmentioning

confidence: 70%

Scanning tunneling microscopy of the annealing of a thin platinum film on highly oriented pyrolytic graphite

Zhou¹,

Gülari²

1991

Acta Cryst Sect A

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Scanning tunneling microscopy (STM) was used to study morphological changes of a Pt thin film deposited on highly oriented pyrolytic graphite (HOPG) during an annealing process. In air, it was possible to image the morphology of the thin film with a vertical resolution of 0.5 A, and a lateral resolution of 20 A. Surface structural change was observed after the annealing processes. When the annealing temperature was below 573 K, surface morphology changed only slightly. Between 573 and 873 K, the originally uniformly distributed rolling hills of Pt coagulated into larger clumps. Above 873 K, Pt crystal facets started to form on the surface. At 1123 K, a large portion of the surface turned into well defined Pt crystal facets. Above 1123 K, the Pt film started to crack and formed scattered crystals on the HOPG surface. A complementary X-ray diffraction measurement showed that the crystallized Pt film was preferentially oriented with the (111) plane parallel to the substrate graphite (0001) basal plane, indicating epitaxy of the Pt overlayer with the graphite substrate underneath.

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Tunneling microscopy from 300 to 4.2 K

Cited by 29 publications

References 1 publication

Scanning tunneling microscopy—from birth to adolescence

Scanning tunneling microscopy—from birth to adolescence

Mechanical and Electrical Properties of Nanosized Contacts on Single-Walled Carbon Nanotubes

Scanning tunneling microscopy of the annealing of a thin platinum film on highly oriented pyrolytic graphite

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