2015
DOI: 10.31399/asm.cp.istfa2015p0071
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Turning Sample Into (Re)Solution—Focused Ion Beam Shaped Solid Immersion Lenses

Abstract: This work is a unique solution for enhancing optical failure analysis and optical signal transmission. Optical failure analysis remains to be a vital part of the analysis process, despite shrinking feature sizes and challenging package technologies. The presented optical signal transmission supports the development of photonic integrated circuits. The key component is a Focused Ion Beam (FIB) process which shapes optical lenses out of the sample material leading to an improvement in lateral resolution and sign… Show more

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