UHF intermodulation product prediction in digital systems using SPICE: The need for nonlinear macromodels

Konefal, T.; Marvin, A.C.

doi:10.1049/ip-smt:19960547

Cited by 3 publications

(1 citation statement)

References 7 publications

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“…It would be useful to be able to predict the levels of jitter, and researchers have modeled the susceptibility of logic devices to EMI using circuit analysis tools such as SPICE [1], [6], [7]. Although these can give accurate results, they may be complicated to set up and SPICE simulations sometimes require knowledge of the internal workings of devices that manufacturers are unwilling to supply [8]. Our approach has therefore been to concentrate on "intermediate level tools": analytical or empirical design methods that are sufficiently accurate to be useful, while being simple enough to use at an early stage in the design process.…”

Section: Introductionmentioning

confidence: 99%

A simple model of emi-induced timing jitter in digital circuits, its statistical distribution and its effect on circuit performance

Robinson

Fischer²,

Flintoft

et al. 2003

IEEE Trans. Electromagn. Compat.

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Section: Introductionmentioning

confidence: 99%

A simple model of emi-induced timing jitter in digital circuits, its statistical distribution and its effect on circuit performance

Robinson

Fischer²,

Flintoft

et al. 2003

IEEE Trans. Electromagn. Compat.

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Correlation of timing jitter and the re-emission spectrum in radiated immunity testing of digital hardware

Flintoft¹,

Robinson²,

Fischer³

et al.

2001 IEEE EMC International Symposium. Symposium Record. International Symposium on Electromagnetic Compatibility (Cat. No.01CH

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The re-emission spectrum of digital hardware subjected to emi

Flintoft

Marvin

Robinson

et al. 2003

IEEE Trans. Electromagn. Compat.

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Article:Flintoft, I D orcid.org/0000-0003-3153-8447, Marvin, A C orcid.org/0000-0003-2590-5335, Robinson, M P orcid.org/0000-0003-1767-5541 et al. (2 more Abstract-The emission spectrum of digital hardware under the influence of external electromagnetic interference is shown to contain information about the interaction of the incident energy with the digital circuits in the system. The generation mechanism of the re-emission spectrum is reviewed, describing how nonlinear effects may be a precursor to the failure of the equipment under test. Measurements on a simple circuit are used to demonstrate how the characteristics of the re-emission spectrum may be correlated with changes to the digital waveform within the circuit. The technique is also applied to a piece of complex digital hardware where similar, though more subtle, effects can be measured. It is shown that the re-emission spectrum can be used to detect the interaction of the interference with the digital devices at a level well below that which is able to cause static failures in the circuits. The utility of the technique as a diagnostic tool for immunity testing of digital hardware, by identifying which subsystems are being affected by external interference, is also demonstrated.

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UHF intermodulation product prediction in digital systems using SPICE: The need for nonlinear macromodels

Cited by 3 publications

References 7 publications

A simple model of emi-induced timing jitter in digital circuits, its statistical distribution and its effect on circuit performance

A simple model of emi-induced timing jitter in digital circuits, its statistical distribution and its effect on circuit performance

Correlation of timing jitter and the re-emission spectrum in radiated immunity testing of digital hardware

The re-emission spectrum of digital hardware subjected to emi

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