2014
DOI: 10.1038/ncomms5243
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Ultra-high aspect ratio high-resolution nanofabrication for hard X-ray diffractive optics

Abstract: Although diffractive optics have played a major role in nanoscale soft X-ray imaging, highresolution and high-efficiency diffractive optics have largely been unavailable for hard X-rays where many scientific, technological and biomedical applications exist. This is owing to the long-standing challenge of fabricating ultra-high aspect ratio high-resolution dense nanostructures. Here we report significant progress in ultra-high aspect ratio nanofabrication of high-resolution, dense silicon nanostructures using v… Show more

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Cited by 173 publications
(170 citation statements)
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“…Other potentially undesirable results include the lateral etching of the nanocatalyst ( Figure 1C, Scheme 3) or lack of etching altogether ( Figure 1C, Scheme 4). AuNPs are understood to catalyze etching preferentially in the <100> direction but can also deviate from this path because of the nonhomogenous injection of holes from other surrounding catalysts 50 and their own facets 47 or to dislodgement by the hydrogen gas produced during etching.…”
Section: Resultsmentioning
confidence: 99%
“…Other potentially undesirable results include the lateral etching of the nanocatalyst ( Figure 1C, Scheme 3) or lack of etching altogether ( Figure 1C, Scheme 4). AuNPs are understood to catalyze etching preferentially in the <100> direction but can also deviate from this path because of the nonhomogenous injection of holes from other surrounding catalysts 50 and their own facets 47 or to dislodgement by the hydrogen gas produced during etching.…”
Section: Resultsmentioning
confidence: 99%
“…With the presence of h + , Si underneath the metal catalysts is etched by HF. MaCE for fabrication of HAR nanostructures on Si, such as nanowires, [9][10][11][12][13][14][15][16] nanogratings 17 and nanopores, 18 have been extensively studied. Recently, capability of MaCE in fabricating uniform micrometer-scale HAR structures was demonstrated.…”
mentioning
confidence: 99%
“…However, at the same time, a high efficiency hard X-ray FZP would need to have a very high t, measured in microns, resulting in aspect ratios, Ar=t/Δr, of hundreds. This kind of aspect ratio is very difficult to achieve by using the standard lithographic methods and requires novel fabrication routes [14,24].…”
Section: Introductionmentioning
confidence: 99%