Ultrahigh vacuum magnetic force microscopy: domain imaging on in situ grown Fe(100) thin films

Memmert, U.; Leinenbach, P.; Lösch, J.; Hartmann, Uwe

doi:10.1016/s0304-8853(98)00269-8

Cited by 12 publications

(6 citation statements)

References 21 publications

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“…Such a deduction requires a very detailed interpretation of the experimental data (19). Figure 13 analysis of locally appearing ripple patterns and stray-field variations caused by morphological defects in the film, as well as from the Néel wall contrast, it is possible to deduce the domain configuration shown in Figure 13b.…”

Section: Micromagnetic Investigationsmentioning

confidence: 99%

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Magnetic Force Microscopy

Hartmann

1999

Annu. Rev. Mater. Sci.

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367

217

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This review on magnetic force microscopy does not provide an exhaustive overview of the past accomplishments of the method but rather discusses the present state of the art. Magnetic force microscopy is a special mode of noncontact operation of the scanning force microscope. This mode is realized by employing suitable probes and utilizing their specific dynamic properties. The particular material composition of the probes and the dynamic mode of their operation are discussed in detail. The interpretation of images acquired by magnetic force microscopy requires some basic knowledge about the specific near-field magnetostatic interaction between probe and sample. The general magnetostatics as well as convenient simplifications of the general theory, which often can be used in practice, are summarized. Applications of magnetic force microscopy in the magnetic recording industry and in the fundamental research on magnetic materials are discussed in terms of representative examples. An important aspect for any kind of microscopy is the ultimately achievable spatial resolution and inherent restrictions in the application of the method. Both aspects are considered, and resulting prospects for future methodical improvements are given.

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Section: Micromagnetic Investigationsmentioning

confidence: 99%

“…The experimentally recorded and the micromagnetically modeled cross-sectional profiles are displayed in Figure 11b,c. The model calculations have been performed on the basis of a 90 • Néel wall (19). The appearance of a 90 • Bloch-type wall in an 80-nm thick Fe film is shown in Figure 11d-f.…”

Section: Micromagnetic Investigationsmentioning

confidence: 99%

Magnetic Force Microscopy

Hartmann

1999

Annu. Rev. Mater. Sci.

Self Cite

367

217

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“…6(f), the stray field of each 90 • Néel wall will produce a maximum and a minimum in the MFM image contrast. 24,25 Therefore, the stripe number in the image appears to be doubled. The disorder of the stripe pattern in this case could be due to the poorer sensitivity to the 90 • Néel walls in MFM and possibly finer magnetic structures.…”

Section: Resolving Magnetic Easy Axes In Lsmomentioning

confidence: 99%

Origin of the uniaxial magnetic anisotropy in La0.7Sr0.3MnO3on s

Wang¹

2013

Phys. Rev. B

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“…Most of this preliminary work was devoted to imaging written bit structures in magnetic recording materials and to investigating the contrast mechanism [287][288][289][290]. Experiments were successfully performed under many different environmental conditions such as in ambient air, vacuum [206], UHV [134,291,292], low temperatures [293][294][295], and strong magnetic fields [296]. Experiments were successfully performed under many different environmental conditions such as in ambient air, vacuum [206], UHV [134,291,292], low temperatures [293][294][295], and strong magnetic fields [296].…”

Section: Wqmentioning

confidence: 99%

Scanning Probe Microscopy

Meyer

Hug

Bennewitz

2004

Advanced Texts in Physics

347

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Lesson: Scanning Probe Microscopy: "feeling" what you can't see at the nanometer scale Standards:HS-PS1-3. Plan and conduct an investigation to gather evidence to compare the structure of substances at the bulk scale to infer the strength of electrical forces between particles.HS-PS2-6. Communicate scientific and technical information about why the molecular-level structure is important in the functioning of designed materials.HS-PS2-1. Analyze data to support the claim that Newton's second law of motion describes the mathematical relationship among the net force on a macroscopic object, its mass, and its acceleration.HS-ETS1-2. Design a solution to a complex real-world problem by breaking it down into smaller, more manageable problems that can be solved through engineering.

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Ultrahigh vacuum magnetic force microscopy: domain imaging on in situ grown Fe(100) thin films

Cited by 12 publications

References 21 publications

Magnetic Force Microscopy

Magnetic Force Microscopy

Origin of the uniaxial magnetic anisotropy in La0.7Sr0.3MnO3on s

Scanning Probe Microscopy

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