2011
DOI: 10.1116/1.3575552
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Ultraviolet photodetectors based on MgZnO thin films

Abstract: In this work, Ti/Au Ohmic contacts to both Mg0.24Zn0.76O and ZnO film-based metal-semiconductor-metal (MSM) photodetectors (PDs) were fabricated on glass substrates for comparative analysis. The transmittance spectra measured around the optical energy gap revealed that Mg0.24Zn0.76O films have a larger optical energy gap (3.54 eV) than ZnO films (3.25 eV). Mg0.24Zn0.76O MSM-structured ultraviolet (UV) PDs show a much higher UV-to-visible rejection ratio of 2.78×103 than those made of ZnO films. This can be att… Show more

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Cited by 16 publications
(7 citation statements)
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“…As the BeO layer has been proven to be an ineffective carrier blocking layer in our previous reports, 17,18 it will be ignored in our following discussions on carrier transportation behavior in this multilayer structure. During the growth, the Mg Knudsen cell is controlled at 362 C, 383 C, and 384.5 C for B-MgZnO, L-MgZnO, and H-MgZnO layers, while keeping the Zn cell and substrate temperature at 310 C and 450 C. The in-plane epitaxial relationship is [11][12][13][14][15][16][17][18][19][20] MgZnO // [11][12][13][14][15][16][17][18][19][20] BeO // Si confirmed by reflection high-energy electron diffraction (RHEED) and transmission electron microscope (TEM). 17 More details of the epitaxial growth can be found elsewhere.…”
mentioning
confidence: 94%
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“…As the BeO layer has been proven to be an ineffective carrier blocking layer in our previous reports, 17,18 it will be ignored in our following discussions on carrier transportation behavior in this multilayer structure. During the growth, the Mg Knudsen cell is controlled at 362 C, 383 C, and 384.5 C for B-MgZnO, L-MgZnO, and H-MgZnO layers, while keeping the Zn cell and substrate temperature at 310 C and 450 C. The in-plane epitaxial relationship is [11][12][13][14][15][16][17][18][19][20] MgZnO // [11][12][13][14][15][16][17][18][19][20] BeO // Si confirmed by reflection high-energy electron diffraction (RHEED) and transmission electron microscope (TEM). 17 More details of the epitaxial growth can be found elsewhere.…”
mentioning
confidence: 94%
“…Until now, most of the Mg x Zn 1Àx O UV PDs have been constructed on insulating sapphire substrates with planar metal-semiconductor-metal (MSM) structures. 13,14 These PDs are not compatible with the mature Si micro-electronic technologies and thus unlikely to be applied in modern integrated circuits. There are some limited reports of Mg x Zn 1Àx O UV PDs fabricated on Si wafers with cutoff wavelengths in visible-blind region.…”
mentioning
confidence: 99%
“…The ZnMgO solid solution system is of interest due to the possibility to tailor many important physical properties by varying their composition. This alloy system covers a wide ultraviolet (UV) spectral range between the direct bandgaps of 3.36 eV for ZnO and 7.8 eV for MgO at room temperature, making it very attractive for short-wavelength optical applications such as UV detectors [1][2][3][4][5] and light emitters [6][7][8][9].…”
Section: Introductionmentioning
confidence: 99%
“…Various techniques have been used for the preparation of ZnMgO films such as radio-frequency plasma-assisted molecu-lar beam epitaxy (RF-MBE) [2,7,10,11], DC [12,13] and RF [1,3,6] magnetron sputtering, pulsed laser deposition (PLD) [14,15], plasma-enhanced atomic layer deposition (PE-ALD) [16], chemical vapor deposition (CVD) [17], metal-organic chemical vapor deposition (MOCVD) [18,19], hydrothermal [4], chemical bath deposition (CBD) [20], sol-gel spin coating [21][22][23][24][25][26][27][28][29], and spray pyrolysis [28][29][30][31][32][33][34]. Among these techniques, the sol-gel spin coating method has the advantage of ensuring easy control and handling of chemicals and substrates, as well as excellent control over stoichiometry.…”
Section: Introductionmentioning
confidence: 99%
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