Unambiguous analytical inversion of multiple thickness ellipsometric data for an embedded nonabsorbing uniform layer

Tsutsumanova, Gichka G.; Lyutov, Dimitar; Tzonev, Atanas N.; Russev, Stoyan C.

doi:10.1016/j.ijleo.2015.07.131

Optik

2015

DOI: 10.1016/j.ijleo.2015.07.131

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Unambiguous analytical inversion of multiple thickness ellipsometric data for an embedded nonabsorbing uniform layer

Gichka G. Tsutsumanova¹,

Dimitar Lyutov²,

Atanas N. Tzonev³

et al.

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Unambiguous analytical inversion of multiple thickness ellipsometric data for an embedded nonabsorbing uniform layer

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References 9 publications

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