2021
DOI: 10.26599/tst.2019.9010045
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Uniform non-Bernoulli sequences oriented locating method for reliability-critical gates

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Cited by 9 publications
(1 citation statement)
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“…Existing approaches do not sufficiently consider the use times of the RCA or the non-original input or output times. Xiao et al [15] and Ouyang et al [16] discussed gates and fault tolerant design.…”
Section: Introductionmentioning
confidence: 99%
“…Existing approaches do not sufficiently consider the use times of the RCA or the non-original input or output times. Xiao et al [15] and Ouyang et al [16] discussed gates and fault tolerant design.…”
Section: Introductionmentioning
confidence: 99%