2005
DOI: 10.1021/cm050145a
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Unusual Dielectric Relaxation in Lightly Doped n-Type Rhombohedral BaTi0.85Zr0.15O3:Ta Ferroelectric Ceramics

Abstract: The dielectric properties of tantalum doped BaTi 0.85 Zr 0.15 O 3 were investigated. The conventional solid state reaction method was used to make the ceramic samples. The composition was close to the pinch point of the three structure phase transitions in BaTiO 3 . Powder X-ray diffraction result indicated that the samples were in very slightly distorted rhombohedral structure at room temperature, and the dielectric measurement showed only cubic-to-rhombohedral phase transition occurred. Instead of a sharp pe… Show more

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Cited by 30 publications
(25 citation statements)
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“…1, 3 On basis of the data in Fig. 3, we can plot the curve of the logarithm of the relaxation time versus 1 / T, as shown in Fig.…”
Section: Resultsmentioning
confidence: 99%
See 3 more Smart Citations
“…1, 3 On basis of the data in Fig. 3, we can plot the curve of the logarithm of the relaxation time versus 1 / T, as shown in Fig.…”
Section: Resultsmentioning
confidence: 99%
“…A step size of 0.05°with a step time of 1 s was used for the 2 range of 10°-70°. As-grown crystals were oriented along the ͗001͘ cub direction on basis of the XRD results and were cut into the dimensions of 5 ϫ 5 ϫ 1 mm 3 . The asprepared samples were sputtered with gold to create two electrodes on either side of the sample.…”
Section: Methodsmentioning
confidence: 99%
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“…Nevertheless, a well-matched interface between ferrite and BaTiO 3 was produced with a wet chemical method by carefully controlling the experimental conditions [27,36,37]. Oxygen vacancies are the most common defects in perovskites and spinels, and are formed during sintering at high temperatures and low partial oxygen pressures [38]. Such defects appearing at the interface will act as charge traps, resulting in a high dielectric loss.…”
Section: Introductionmentioning
confidence: 99%